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dc.contributor.authorHeo, Seongmooen_US
dc.contributor.authorBarr, Kennethen_US
dc.contributor.authorHampton, Marken_US
dc.contributor.authorAsanovi_, Krsteen_US
dc.date.accessioned2023-03-29T15:35:04Z
dc.date.available2023-03-29T15:35:04Z
dc.date.issued2002-01
dc.identifier.urihttps://hdl.handle.net/1721.1/149935
dc.relation.ispartofseriesMIT-LCS-TR-832
dc.titleFine-Grain Dynamic Leakage Reductionen_US


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