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dc.contributor.authorGruber, S.en_US
dc.contributor.authorIngraham, J. C.en_US
dc.contributor.authorBuntschuh, C. D.en_US
dc.contributor.authorHooper, E. B., Jr.en_US
dc.contributor.authorCoccoli, J. D.en_US
dc.contributor.authorBekefi, Georgeen_US
dc.contributor.authorWhitehouse, D. R.en_US
dc.contributor.authorFreyheit, P. J.en_US
dc.contributor.authorRadoski, H. R.en_US
dc.date.accessioned2010-04-24T05:18:21Z
dc.date.available2010-04-24T05:18:21Z
dc.date.issued1962-07-15en_US
dc.identifierRLE_QPR_066_Xen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/53766
dc.descriptionContains reports on seven research projects.en_US
dc.description.sponsorshipAtomic Energy Commission under Contract AT(30-1)1842en_US
dc.description.sponsorshipAir Force Cambridge Research Center under Contract AF-19(604)-5992en_US
dc.description.sponsorshipNational Science Foundation (Grant G-9330)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1962en_US
dc.relation.ispartofPlasma Dynamicsen_US
dc.relation.ispartofPlasma Physicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 66en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherPlasma Physicsen_US
dc.subject.otherNegative Conductivityen_US
dc.subject.otherElectron Temperature Decay in Helium Plasma Afterglowen_US
dc.subject.otherElectron Energies from the Langevin Equationen_US
dc.subject.otherHarmonics of Electron-Cyclotron Emission from Low and Intermediate Pressure Dischargesen_US
dc.subject.otherOne-Megacycle Bridge for Plasma Measurementsen_US
dc.subject.otherDispersion Relation for Longitudinal Plasma Wavesen_US
dc.subject.otherComments on Plasma Constrictionen_US
dc.titlePlasma Physicsen_US
dc.typeTechnical Reporten_US


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