Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction

Author(s)
Heo, Seongmoo; Asanovi_, Krste
Thumbnail
DownloadMIT-LCS-TR-831.pdf (120.0Kb)
Metadata
Show full item record
Date issued
2002-01
URI
https://hdl.handle.net/1721.1/149934
Series/Report no.
MIT-LCS-TR-831
Collections