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Leakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reduction

dc.contributor.authorHeo, Seongmooen_US
dc.contributor.authorAsanovi_, Krsteen_US
dc.date.accessioned2023-03-29T15:35:02Z
dc.date.available2023-03-29T15:35:02Z
dc.date.issued2002-01
dc.identifier.urihttps://hdl.handle.net/1721.1/149934
dc.relation.ispartofseriesMIT-LCS-TR-831
dc.titleLeakage-Biased Domino Circuits for Dynamic Fine-Grain Leakage Reductionen_US


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